Acceleration voltage:
[keV]
beta (v/c):
Electron wavelength:
[Å]
Momentum transfer:
[mrad]
=
[Å-1]
Energy loss:
[eV]
Characteristic half-angle θE =
[mrad]
Bethe ridge cuttoff θr =
[mrad]
Inelastic Delocalization
This is a web-based tool for calculating inelastic mean free path (IMFP) and knock-on damage threshold for transmission electron microscopy. The IMFP calculator codes were modified from Dr. A. Husain's codes, which were based on the Matlab code of Dr. R. Egerton. Knock-on damage threshold calculations were adapted from Egerton, Li and Malac, Radiation Damage in the TEM and SEM, Micron 35 399–409 (2004). The delocalization calculator is based on the R.F. Egerton's Electron Energy-loss Spectroscopy in the Electron Microscope, Sec.3.11.
Webpage maintained by Sean Kung at the University of British Columbia.
Formula:
Convergence half-angle:
[mrad]
Acceptance half-angle:
[mrad]
Unit cell volume:
[Å3]
Formula per unit cell:
Mass density:
[g/cm3]
Diffraction limited probe:
[Å]
Inelastic Mean Free Path
Knock-on Damage